Call Us 080-41656200 (Mon-Sat: 10AM-8PM)
Free Shipping above Rs. 1499
Cash On Delivery*

Characterization of C-V curves and Analysis, Using VEE Pro Software


Marketed By :  VDM Verlag Dr. Müller   Sold By :  Kamal Books International  
Delivery in :  10-12 Business Days


Check Your Delivery Options

Rs. 3,651

Availability: In stock

  • Product Description
The most commonly used tool for studying gate-oxide quality in detail is the Capacitance-Voltage (C-V) technique. C-V test results offer a wealth of device and process Information, including bulk and interface charges and many MOS-device parameters.This Project will devote for how to use the Agilent LCR meter (E-4980A) to make C-V measurements. It also addresses basic MOS physics, proper C-V measurement techniques, and parameter extraction from C-V test results. C-V measurements are typically made on a capacitor- like device, such as a MOS capacitor (MOS-C). Successful measurements require compensating for stray capacitance, recording capacitance values only at equilibrium conditions, and applying measuring signals in an appropriate sequence. These issues are addressed in my project under result chapter to provide guidance for choosing and/or writing test routines and preparing for C-V tests. This work has Introduction (Chapter-1), VEE-Pro Software (Chapter-2), SUPREM Simulation (Chapter-3), Fabrication of MOS(Oxidation) (Chapter-5), Capacitances of MOS (Chapter-6), Record the data of C-V curves (Chapter-7) and Conclusion (Chapter-8).
Product Specifications
SKU :COC13644
Number of Pages84
Publishing Year5/14/2010
Edition1 st
Book TypeElectronics & communications engineering
Country of ManufactureIndia
Product BrandVDM Verlag Dr. Müller
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-07-23 00:00:00