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Far- and Near-field characterization of small radiation sources

Far- and Near-field characterization of small radiation sources

 

Marketed By :  LAP LAMBERT Academic Publishing   Sold By :  Kamal Books International  
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  • Product Description
 

This book presents experimental studies on small radiation sources such as subwavelength apertures, photonic crystal lasers, and microdisk lasers in their far- and near-field regimes. For the far-field characterization of highly divergent emissions, a solid angle scanner which is capable of scanning a detector and necessary optics over the surface of a sphere centered at the sources is developed. Polarization-resolved two-dimensional angular distributions are measured with this instrument. For the near-field characterization of subwavelength structures, a near-field scanning optical microscope which scans a fiber probe over the source surface with shear-force distance regulation using dual tuning forks is developed. Spectrally-resolved near- field images are measured with this instrument.

Product Specifications
SKU :COC43191
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-01-08
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