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High-Speed Probe Card Analysis

 

Marketed By :  LAP LAMBERT Academic Publishing   Sold By :  Kamal Books International  
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Rs. 2,675

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  • Product Description
 

Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change.

Product Specifications
SKU :COC92532
AuthorBonghun Shin
LanguageEnglish
BindingPaperback
Number of Pages68
Publishing Year2013-11-23T00:00:00.000
ISBN9783659488351
Edition1 st
Book TypeProduction engineering
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-10-08 00:00:00