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Modelling Atomic Structure in Amorphous Solids and X-Ray Diffraction


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  • Product Description

X-ray diffraction experiments were conducted on Zr base, Fe base, Ge base amorphous metal and several other kinds of amorphous material. On the other hand, computer simulations of X-ray diffraction of these materials were also developed, by means of applying Debye formula and Ehrenfest’s Formula, on the Ideal Amorphous Model (IAS). The results of the experiments and simulations were compared and analysed; however, although some results had high agreement between experiment and simulation, a portion of materials gave inconsistent results. The reasons of the inconsistency were found and analysed; a further developed X-ray diffraction simulation method was developed by using Generalized Debye Formula; and instead of IAS model, a new and more specific model were obtained, by using new simulation atomic packing technique. Finally, more accurate models were found and Generalized Debye Formula is introduced, which successfully solved the problem of disagreement of experiment and simulation X-ray diffraction results.

Product Specifications
SKU :COC40660
AuthorRuixing Feng
Number of Pages128
Publishing Year2012-05-09T00:00:00.000
Edition1 st
Book TypePhysical chemistry
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-02-08 00:00:00
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