Surface Roughness Study by Atomic Force Microscopy

Surface Roughness Study by Atomic Force Microscopy


Marketed By :  LAP LAMBERT Academic Publishing   Sold By :  Kamal Books International  
Delivery in :  10-12 Business Days

₹ 3,651

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  • Product Description

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

Product Specifications
SKU :COC49907
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-06-08
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