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Test Infrastructure Design

 

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  • Product Description
 

Current-generation SOCs contain a heterogeneous mix of embedded cores, which include not only flat (non-hierarchical) digital modules, but also analog and hierarchical modules. The increase in SOC complexity has also been accompanied by the development of more versatile automatic test equipment (ATE). This book presents methods for modular test of heterogeneous SOCs, whereby test cost is reduced by combining effective test infrastructure design with efficient utilization of ATE resources. Test infrastructure design refers to the design and optimization of test wrappers and test access mechanisms, as well as test scheduling for efficient resource utilization.

Product Specifications
SKU :COC82654
AuthorAnuja Banerjee and Krishnendu Chakrabarty
LanguageEnglish
BindingPaperback
Number of Pages188
Publishing Year2011-02-28T00:00:00.000
ISBN978-3843373593
Edition1 st
Book TypeProduction engineering
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-10-08 00:00:00
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