"The Impact of Circuit Nonlinearities and Noise in OFDM Receivers" is a graduate level research book, of interest to design engineers of OFDM RF-front ends as well as researchers in the area. The topics are covered in a coherent and independent manner to provide flexibility to the reader. In particular, the effects of circuit nonlinearities, phase noise and tonal interference on OFDM systems are addressed. Regarding memoryless nonlinearities, the task of identifying the generated inter-modulation products is resolved using combinatorial methods. Closed-form expressions are obtained for the SNR degradation under 3rd order nonlinearities and the methodology is extended to give exact SNR expressions in the presence of one or more adjacent channels. Furthermore, the effect of phase noise is approached from a novel angle, extending for the first time the analysis to the effect of power-law phase noise, typically present in RF oscillatory systems. Finally, it is shown that the effect of tonal interference varies with the interference frequency.