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Transistor-Level Defect-Tolerant Techniques for Reliable Design

 

Marketed By :  LAP LAMBERT Academic Publishing   Sold By :  Kamal Books International  
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  • Product Description
 

In this book, detailed investigation of a recently proposed transistor-level defect-tolerant technique for nanoelectronics is performed. The investigated technique replaces each transistor by an N^2-transistor structure (N=2,3…,k) and guarantees defect tolerance of all permanent defects of multiplicity ? (N-1) in each transistor structure. The theoretical and experimental analysis for the defect tolerance of stuck-open and stuck-short defects for quadded transistor structure i.e.,(N=2) is extended for the nona transistor structure i.e.,(N=3). Comparison of defect tolerance of transistor structures (N=2,3) against other techniques like Triple Intervowen Redundancy (TIR) and Quadded Logic (QL) is carried out experimentally. It is shown that the combinations of defect tolerance at both the transistor level and gate level have significantly improved circuit defect tolerance. For this, combination of Triple Modular Redundancy (TMR) with majority gate implemented with N^2-transistor structure is investigated in this thesis. Application of N^2-transistor structure for handling soft errors is also investigated and a novel approach based on quadded transistor structure is proposed.

Product Specifications
SKU :COC52746
AuthorFarhan Khan
LanguageEnglish
BindingPaperback
Number of Pages228
Publishing Year2012-03-08T00:00:00.000
ISBN978-3846544334
Edition1 st
Book TypeElectronics & communications engineering
Country of ManufactureIndia
Product BrandLAP LAMBERT Academic Publishing
Product Packaging InfoBox
In The Box1 Piece
Product First Available On ClickOnCare.com2015-06-08 00:00:00
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